Si Detectors and Characterization for HEP and Photon Science Experiment: How to Design Detectors by TCAD Simulation

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Management number 232000198 Release Date 2026/06/18 List Price $23.94 Model Number 232000198
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This book reviews the HL-LHC experiments and the fourth-generation photon science experiments, discussing the latest radiation hardening techniques, optimization of device & process parameters using TCAD  simulation tools, and the experimental characterization required to develop rad-hard Si detectors for x-ray induced surface damage and bulk damage by hadronic irradiation.Consisting of eleven chapters, it introduces various types of strip and pixel detector designs for the current upgrade, radiation, and dynamic range requirement of the experiments, and presents an overview of radiation detectors, especially Si detectors. It also describes the design of pixel detectors, experiments and characterization of Si detectors.The book is intended for researchers and master’s level students with an understanding of radiation detector physics. It provides a concept that uses TCAD simulation to optimize the electrical performance of the devices used in the harsh radiation environment of the colliders and at XFEL. Read more

ASIN B07XWXCNQN
XRay Not Enabled
ISBN13 978-3030195311
Edition 1st ed. 2019
Language English
File size 36.7 MB
Page Flip Enabled
Publisher Springer
Word Wise Not Enabled
Print length 297 pages
Accessibility Learn more
Screen Reader Supported
Publication date September 13, 2019
Enhanced typesetting Enabled

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